Lee C. Archie: search on Z-Library

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1

The Chinese Creation Myth of Nu Kua and the Biblical Narrative in Genesis 1-11

Lee, Archie C.C.

Journal:

Biblical Interpretation A Journal of Contemporary Approaches

Year:

1994

Language:

english

File:

PDF, 694 KB

english, 1994

2

Identity, Reading Strategy and Doing Theology

Lee, Archie C.C.

Journal:

Biblical Interpretation A Journal of Contemporary Approaches

Year:

1999

Language:

english

File:

PDF, 300 KB

english, 1999

3

Genesis i aNd the Plagues Tradition in Psalm Cv

Lee, Archie C.C.

Journal:

Vetus Testamentum

Year:

1990

Language:

english

File:

PDF, 333 KB

english, 1990

4

The Bible in Chinese Christianity

Lee, Archie C. C.

Journal:

The Ecumenical Review

Year:

2015

Language:

english

File:

PDF, 120 KB

english, 2015

5

Returning To China: Biblical Interpretation in Postcolonial Hong Kong

Lee, Archie C.C.

Journal:

Biblical Interpretation A Journal of Contemporary Approaches

Year:

1999

Language:

english

File:

PDF, 1.08 MB

english, 1999

6

Genesis I and the Plagues Tradition in Psalm CV

Archie C. C. Lee

Journal:

Vetus Testamentum

Year:

1990

Language:

english

File:

PDF, 572 KB

english, 1990

7

The effects of coal particle size on spontaneous combustion characteristics

Rifella, Archi, Setyawan, Daru, Chun, Dong Hyuk, Yoo, Jiho, Kim, Sang Do, Rhim, Young Joon, Choi, Ho Kyung, Lim, Jeonghwan, Lee, Sihyun, Rhee, Youngwoo

Journal:

International Journal of Coal Preparation and Utilization

Year:

2019

Language:

english

File:

PDF, 3.57 MB

english, 2019

8

A SELF-DIRECTED GRADUATE SEMINAR

Lee C. Archie, B. G. Hurdle Jr

Journal:

Year:

1978

Language:

english

File:

PDF, 536 KB

english, 1978

9

Behavioural inbreeding avoidance in wild African elephants

ELIZABETH A. ARCHIE, JULIE A. HOLLISTER-SMITH, JOYCE H. POOLE, PHYLLIS C. LEE, CYNTHIA J. MOSS, JÉSUS E. MALDONADO, ROBERT C. FLEISCHER, SUSAN C. ALBERTS

Journal:

Molecular Ecology

Year:

2007

Language:

english

File:

PDF, 195 KB

english, 2007

10

Association patterns of African elephants in all-male groups: the role of age and genetic relatedness

Patrick I. Chiyo, Elizabeth A. Archie, Julie A. Hollister-Smith, Phyllis C. Lee, Joyce H. Poole, Cynthia J. Moss, Susan C. Alberts

Journal:

Animal Behaviour

Year:

2011

Language:

english

File:

PDF, 263 KB

english, 2011

11

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Study of critical dimension and overlay measurement methodology using SEM image analysis for process control

Lee, Tae Yong, Lee, Byoung Ho, Chin, Soo Bok, Cho, Young Sun, Hong, Jun Sik, Hong, Jong Seo, Song, Chang Lyong, Archie, Chas N.

Year:

2006

Language:

english

File:

PDF, 670 KB

english, 2006

12

Conceptions of Space and Time: Sources, Evolution, Directionsby Murad D. Akhundov; Charles Rougle

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1988

Language:

english

File:

PDF, 514 KB

english, 1988

13

Using Extracted Teeth for Research

Lee, Jason Jonghyuk, Nettey-Marbell, Anthony, Cook, Archie, Pimenta, Luiz A.F., Leonard, Ralph, Ritter, André V.

Journal:

Journal of the American Dental Association

Year:

2007

Language:

english

File:

PDF, 85 KB

english, 2007

14

Peirce's Philosophy of Science: Critical Studies in His Theory of Induction and Scientific Methodby Nicholas Rescher

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1979

Language:

english

File:

PDF, 260 KB

english, 1979

15

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - ArF pellicle degradation mechanism for resolving CD variation

Choi, Hyungseok, Archie, Chas N., Ahn, Yohan, Ryu, Jua, Lee, Yangkoo, An, Bumhyun, Lee, Seokryeol

Year:

2007

Language:

english

File:

PDF, 724 KB

english, 2007

16

WHO'S WHO: THE OLD TESTAMENT, TOGETHER WITH THE APOCRYPHAby Joan Comay; Jean Comay

Review by: Archie C. C. Lee

Journal:

Year:

1996

Language:

english

File:

PDF, 285 KB

english, 1996

17

In-Situ Doped Multi-Layer Epitaxial Structures with Abrupt Doping Transitions by Ultra High Vacuum Rapid Thermal Chemical Vapor Deposition (UHV-RTCVD)

ÅztÖjrk, Mehmet C., Muhsin, S., Ban, Ibrahim, Harris, Gari, Sanganeria, Mahesh K., Violette, Katherine E., Lee, Archie

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 500 KB

english, 1994

18

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Ellipsometric studies of the absorption of liquid by photo resist

Jeong, Hee, Archie, Chas N., Kyung, Jaesun, Park, Songyi, Lee, Kiyong, Lee, Hyungjoo, Cheon, Hyuknyeong, An, Ilsin, Lee, Sook

Year:

2007

Language:

english

File:

PDF, 614 KB

english, 2007

19

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - The application of SMASH alignment system for 65-55-nm logic devices

Miyasaka, M., Archie, Chas N., Saito, H., Tamura, T., Uchiyama, T., Hinnen, Paul, Lee, Hyun-Woo, van Kemenade, Marc, Shahrjerdy, Mir, van Leeuwen, Robert

Year:

2007

Language:

english

File:

PDF, 769 KB

english, 2007

20

Incidence of Venous Thromboembolism in Orthopaedic Foot and Ankle Surgeries

Shah, Ashish, Huntley, Samuel, Patel, Harshadkumar, Abyar, Eildar, Lehtonen, Eva, Stibolt, Robert, Lee, Sung, Moon, Andrew, Archie, Adam

Journal:

Foot & Ankle Orthopaedics

Year:

2018

File:

PDF, 647 KB

2018

21

Composition dependence of solid-phase epitaxy in silicon-germanium alloys: Experiment and theory

Haynes, T. E., Antonell, M. J., Lee, C. Archie, Jones, K. S.

Journal:

Physical Review B

Year:

1995

Language:

english

File:

PDF, 664 KB

english, 1995

22

Abdominal Circumference Is Superior to Body Mass Index in Estimating Musculoskeletal Injury Risk

NYE, NATHANIEL S., CARNAHAN, DAVID H., JACKSON, JONATHAN C., COVEY, CARLTON J., ZARZABAL, LEE A., CHAO, SUSAN Y., BOCKHORST, ARCHIE D., CRAWFORD, PAUL F.

Journal:

Medicine & Science in Sports & Exercise

Year:

2014

Language:

english

File:

PDF, 233 KB

english, 2014

23

SAE Technical Paper Series [SAE International SAE 2005 Noise and Vibration Conference and Exhibition - (MAY. 16, 2005)] SAE Technical Paper Series - A New Experimental Methodology to Estimate Tire/Wheel Blocked Force for Road NVH Application

Park, Joonhyung, Gu, Perry, Lee, Ming-Ran, Ni, Archie

Year:

2005

Language:

english

File:

PDF, 314 KB

english, 2005

24

A simple defense of material implication.

Journal:

Notre Dame Journal of Formal Logic

Year:

1979

Language:

english

File:

PDF, 283 KB

english, 1979

25

Evidence of a specific nidation site in ruminants

Sue Y. Lee, Harland W. Mossman, Archie S. Mossman, Guido Del Pino

Journal:

Developmental Dynamics

Year:

1977

Language:

english

File:

PDF, 766 KB

english, 1977

26

Foundations of Space–Time Theories. Minnesota Studies in Philosophy of Science, 8by John S. Earman; Clark N. Glymour; John J. Stachel

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1978

Language:

english

File:

PDF, 547 KB

english, 1978

27

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - CD-etch depth measurement from advanced phase-shift masks and wafers using optical scatterometry

Lee, Kyung M., Archie, Chas N., Yedur, Sanjay, Henrichs, Sven, Tavassoli, Malahat

Year:

2006

Language:

english

File:

PDF, 299 KB

english, 2006

28

Method and Appraisal in the Physical Sciences: The Critical Background to Modern Science, 1800–1905by Colin Howson

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1977

Language:

english

File:

PDF, 337 KB

english, 1977

29

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Detailed analysis of capability and limitations of CD scatterometry measurements for 65- and 45-nm nodes

Pundaleva, Irina, Archie, Chas N., Chalykh, Roman, Lee, JeungWoo, Choi, SeongWoon, Han, Woosung

Year:

2007

Language:

english

File:

PDF, 236 KB

english, 2007

30

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Tools to measure CD-SEM performance

Kim, Jihoon, Archie, Chas N., Jalhadi, Kiran, Deo, Sachin, Lee, Soo-Young, Joy, David

Year:

2006

Language:

english

File:

PDF, 278 KB

english, 2006

31

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Investigation on polarization monitoring mask: pattern design and experimental verification

Hwang, Chan, Archie, Chas N., Park, Dong-Woon, Shin, Jang-Ho, Nam, Dong-Seok, Lee, Suk-Joo, Woo, Sang-Gyun, Cho, Han-Ku, Moon, Joo-Tae

Year:

2006

Language:

english

File:

PDF, 171 KB

english, 2006

32

Nucleation and Growth of Polycrystalline Silicon Films in an Ultra high Vacuum Rapid Thermal Chemical Vapor Deposition Reactor Using Disilane and Hydrogen

Violette, Katherine E., Öztürk, Mehmet C., Harris, Gari, Sanganeria, Mahesh K., Lee, Archie, Maher, Dennis M.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 1.92 MB

english, 1994

33

No risk, no gain: effects of crop raiding and genetic diversity on body size in male elephants

Chiyo, P. I., Lee, P. C., Moss, C. J., Archie, E. A., Hollister-Smith, J. A., Alberts, S. C.

Journal:

Behavioral Ecology

Year:

2011

Language:

english

File:

PDF, 172 KB

english, 2011

34

The Rhythm of Being: A Study of Temporalityby Howard Trivers

Review by: Lee C. Archie

Journal:

American Scientist

Year:

1987

Language:

english

File:

PDF, 349 KB

english, 1987

35

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Improved scatterometry method of critical dimension measurements and its application for control of development process

Pundaleva, Irina, Archie, Chas N., Nam, Dongseok, Han, Hakseung, Lee, Donggun, Han, Woosung

Year:

2006

Language:

english

File:

PDF, 330 KB

english, 2006

36

Synthesising 30 Years of Mathematical Modelling of Echinococcus Transmission

Atkinson, Jo-An M., Williams, Gail M., Yakob, Laith, Clements, Archie C. A., Barnes, Tamsin S., McManus, Donald P., Yang, Yu Rong, Gray, Darren J., Willingham, Arve Lee

Journal:

PLoS Neglected Tropical Diseases

Year:

2013

Language:

english

File:

PDF, 365 KB

english, 2013

37

Leptospirosis in American Samoa – Estimating and Mapping Risk Using Environmental Data

Lau, Colleen L., Clements, Archie C. A., Skelly, Chris, Dobson, Annette J., Smythe, Lee D., Weinstein, Philip, Vinetz, Joseph M.

Journal:

PLoS Neglected Tropical Diseases

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

38

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Characterizing optical proximity effect difference among exposure tools

Hong, Jongkyun, Archie, Chas N., Lee, Jeonkyu, Kang, Eunsuk, Yang, Hyunjo, Yim, Donggyu, Kim, Jinwoong

Year:

2006

Language:

english

File:

PDF, 271 KB

english, 2006

39

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Improvement of alignment and overlay accuracy on amorphous carbon layers

Hwang, Young-Sun, Archie, Chas N., Kang, Eung-kil, Lee, Ki-lyoung, Ban, Keun-Do, Bok, Cheol-Kyu, Lim, Chang-Moon, Kim, Hyeong-Soo, Moon, Seung-Chan

Year:

2006

Language:

english

File:

PDF, 530 KB

english, 2006

40

CAROLINA CHEST PAIN TRACKING PROTOCOL SAFELY REDUCES CARDIOVASCULAR INPATIENT TESTING AND MANAGEMENT COSTS

Tyson, Archie A., Cheek, Herman, Folk, Thomas, Rohrbeck, Steven, Kalil, Darryl, Chiu, Jenyung, Mitchell, Sharon, Penry, Lee, Daniel, Kurt

Journal:

Journal of the American College of Cardiology

Year:

2013

Language:

english

File:

PDF, 146 KB

english, 2013

41

Low thermal budget in situ removal of oxygen and carbon on silicon for silicon epitaxy in an ultrahigh vacuum rapid thermal chemical vapor deposition reactor

Sanganeria, Mahesh K., Öztürk, Mehmet C., Violette, Katherine E., Harris, Gari, Lee, C. Archie, Maher, Dennis M.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 245 KB

english, 1995

42

Geodesic lenses in single-mode LiNbO3 waveguides

Chen, Bor-Uei, Marom, Emanuel, Lee, Archie

Journal:

Applied Physics Letters

Year:

1977

Language:

english

File:

PDF, 442 KB

english, 1977

43

Cleaning during Initial Stages of Epitaxial Growth in an Ultrahigh Vacuum Rapid Thermal Chemical Vapor Deposition Reactor

Sanganeria, Mahesh K., Violette, Katherine E., ÖZtÜRk, Mehmet C., Harris, Gari, Lee, C. Archie, Maher, Dennis. M.

Journal:

MRS Proceedings

Year:

1993

Language:

english

File:

PDF, 494 KB

english, 1993

44

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Overlay metrology for dark hard mask process: simulation and experiment study

Shin, Jangho, Archie, Chas N., Chalykh, Roman, Kang, Hyunjae, Kim, SeongSue, Lee, SukJoo, Cho, Han-Ku

Year:

2007

Language:

english

File:

PDF, 652 KB

english, 2007

45

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Inspection sensitivity improvement through optimization of lobe blocking on high-end memory devices

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 580 KB

english, 2007

46

Broadcast Programming and Management

Dessart, George, Coleman, Howard W., Johnson, Joseph S., Jones, Kenneth K., Clift, Charles, Greer, Archie, Goldsen, Rose K., Logan, Ben, Polk, Lee, LeShan, Lda, Benny, Mary Livingstone, Marks, Hilliar

Journal:

Communication Booknotes

Year:

1978

Language:

english

File:

PDF, 3.15 MB

english, 1978

47

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Methodical approach to improve defect detection sensitivity on lithography process using DUV inspection system

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 265 KB

english, 2007

48

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Polarization control for enhanced defect detection on advanced memory devices

Lee, Byoung-Ho, Ihm, Dong-Chul, Yeo, Jeong-Ho, Gluk, Yael, Meshulach, Doron, Archie, Chas N.

Year:

2006

Language:

english

File:

PDF, 151 KB

english, 2006

49

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Novel method of under-etch defect detection for contact layers based on Si substrate using optic wafer inspection tools

Lee, Byoung-Ho, Choi, Jin-Seo, Chin, Soo-Bok, Cho, Do-Hyun, Song, Chang-Lyong, Archie, Chas N.

Year:

2007

Language:

english

File:

PDF, 311 KB

english, 2007

50

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Scatterometry on pelliclized masks: an option for wafer fabs

Gallagher, Emily, Archie, Chas N., Benson, Craig, Higuchi, Masaru, Okumoto, Yasuhiro, Kwon, Michael, Yedur, Sanjay, Li, Shifang, Lee, Sangbong, Tabet, Milad

Year:

2007

Language:

english

File:

PDF, 179 KB

english, 2007

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